Fully customizable systems that can include:
Configurations that range from bench-top to full-height racks of instrumentation
Wafer level and cassette level automation
Compatibility with popular semi- and fully-automatic wafer probers
Test setup tightly integrated with wafer setup
Interactive prober control for setup and analysis
Binning and wafer mapping
Interactive graphical results displayed at both test setup and cassette level review
Configurable, real time results plotted during automation
Report generation and summary tool
Integrated test script development tools
Extensive parametric test library for both Series 2600 and Model 4200-SCS |